Точечные дефекты в полупроводниках : (Գրառման հմ. 37138)

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000 -LEADER
fixed length control field 00974nam a2200205 u 4500
001 - CONTROL NUMBER
control field 000192831
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20240715052949.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 950720s1985 ||||||||||||||||||||rus d
041 ## - LANGUAGE CODE
Language code of text/sound track or separate title rus
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Бургуэн, Жак.
245 10 - TITLE STATEMENT
Title Точечные дефекты в полупроводниках :
Remainder of title Экспериментальные аспекты /
Statement of responsibility, etc. Ж. Бургуэн, М. Ланно ; Пер. Ю.М. Гальперина и др. ; Под ред. В.Л. Гуревича.
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Москва :
Name of publisher, distributor, etc. Мир ,
Date of publication, distribution, etc. 1985.
300 ## - PHYSICAL DESCRIPTION
Extent 304 с. :
Other physical details ил. ;
Dimensions 21 см.
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note Список лит.: с 289-297
534 ## - ORIGINAL VERSION NOTE
Introductory phrase Оригинал на англ. :
Title statement of original Point Defects in Semiconductors II. Experimental Aspects /
Main entry of original J. Bourgoin, M. Lannoo-
Publication, distribution, etc. of original Berlin : Springer-Verlag : 1983
650 14 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Электричество
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Ланно, Мишель
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Гальперин, Ю.М.
Relator term пер.
Relator code trl
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Damaged status Not for loan Home library Current library Full call number Barcode Koha item type Public note
    National Polytechnic University Library National Polytechnic University Library 621.385 Б-91 EU0231948 Books 30 Days Loan
    National Polytechnic University Library National Polytechnic University Library 621.385 Б-91 EU0232428 Books 30 Days Loan

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